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Development of an Easy-to-Use Cryo-Electron Microscope for Simultaneous Observation of SEM and Transmission Images

Published online by Cambridge University Press:  01 August 2018

Yoichi Ose
Affiliation:
Hitachi High-Technologies Corporation, Hitachinaka-shi, Japan.
Takeshi Sunaoshi
Affiliation:
Hitachi High-Technologies Corporation, Hitachinaka-shi, Japan.
Yusuke Tamba
Affiliation:
Hitachi High-Technologies Corporation, Hitachinaka-shi, Japan.
Yasuhira Nagakubo
Affiliation:
Hitachi High-Technologies Corporation, Hitachinaka-shi, Japan.
Junzo Azuma
Affiliation:
Hitachi High-Technologies Corporation, Hitachinaka-shi, Japan.
Ryuichiro Tamochi
Affiliation:
Hitachi High-Technologies Corporation, Hitachinaka-shi, Japan.
Akihiro Narita
Affiliation:
Graduate School of Science, Nagoya University, Nagoya, Japan.
Tomoharu Matsumoto
Affiliation:
Graduate School of Science, Nagoya University, Nagoya, Japan.
Eiji Usukura
Affiliation:
Graduate School of Science, Nagoya University, Nagoya, Japan.
Jiro Usukura
Affiliation:
Graduate School of Science, Nagoya University, Nagoya, Japan.
Masako Osumi
Affiliation:
Japan Women's University, Tokyo, Japan.

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Usukura, E., et al, Sci. Rep. 6 2016) p. 27472.Google Scholar
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[4] Fontana, J. Steven, A. Arch. Biochem. Biophy 5891 2015) p. 86.Google Scholar