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Development and Deployment of Automated Machine Learning Detection in Electron Microcopy Experiments

Published online by Cambridge University Press:  30 July 2021

Kevin G. Field ,
Ryan Jacobs ,
Mingen Shen ,
Matthew Lynch ,
Priyam Patki ,
Christopher Field  and
Dane Morgan
Kevin G. Field
Affiliation:
University of Michigan, United States
Ryan Jacobs
Affiliation:
University of Wisconsin, United States
Mingen Shen
Affiliation:
University of Wisconsin, United States
Matthew Lynch
Affiliation:
University of Michigan, United States
Priyam Patki
Affiliation:
University of Michigan, United States
Christopher Field
Affiliation:
Theia Scientific, LLC, Arlington, Virginia, United States
Dane Morgan
Affiliation:
University of Wisconsin Madison, United States

Abstract

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Type
Evaluation of Materials for Nuclear Applications
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2136 - 2137
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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