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Development and Application of a MEMS-Based In Situ TEM Straining Device for Ultra-Fine Grained Metallic Systems

Published online by Cambridge University Press:  01 August 2004

K Hattar ,
J Han ,
T Saif  and
I M Robertson
K Hattar
Affiliation:
University of Illinois Urbana
J Han
Affiliation:
University of Illinois Urbana
T Saif
Affiliation:
University of Illinois Urbana
I M Robertson
Affiliation:
University of Illinois Urbana
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 50 - 51
Copyright
© 2004 Microscopy Society of America

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