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Developing an Atomic Scale Model of Tilt Grain Boundary Potentials in Perovskite Oxides Using Z-contrast Imaging and EELS

Published online by Cambridge University Press:  01 August 2004

Robert F. Klie ,
Marco Beleggia ,
Yimei Zhu ,
James P. Buban  and
Nigel D. Browning
Robert F. Klie
Affiliation:
Brookhaven National Laboratory, Upton
Marco Beleggia
Affiliation:
Brookhaven National Laboratory, Upton
Yimei Zhu
Affiliation:
Brookhaven National Laboratory, Upton
James P. Buban
Affiliation:
University of Tokyo, Japan
Nigel D. Browning
Affiliation:
University of California, Davis
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 268 - 269
Copyright
© 2004 Microscopy Society of America

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