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Developing a Programmable STEM Detector for the Scanning Electron Microscope

Published online by Cambridge University Press:  01 August 2018

Benjamin W. Caplins ,
Jason D. Holm  and
Robert R. Keller
Benjamin W. Caplins
Affiliation:
Applied Chemicals and Materials Division, National Institute of Standards and Technology, Boulder, CO, United States.
Jason D. Holm
Affiliation:
Applied Chemicals and Materials Division, National Institute of Standards and Technology, Boulder, CO, United States.
Robert R. Keller
Affiliation:
Applied Chemicals and Materials Division, National Institute of Standards and Technology, Boulder, CO, United States.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 658 - 659
Copyright
© Microscopy Society of America 2018 

References

[1] Jacobson, B, et al, Proceedings of SPIE 2015) p. 93760K.Google Scholar
[2] This work is a contribution of the US Government and is not subject to United States copyright.Google Scholar