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Determining the Thickness of Atomically Thin MoS2 and WS2 in the TEM

Published online by Cambridge University Press:  27 August 2014

Ryan J. Wu ,
Michael L. Odlyzko  and
K. Andre Mkhoyan
Ryan J. Wu
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455
Michael L. Odlyzko
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455
K. Andre Mkhoyan
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, MN 55455

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1796 - 1797
Copyright
Copyright © Microscopy Society of America 2014 

References

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[2] Coleman, J.N., et al, Science 331 (2011), p. 568-571.Google Scholar
[3] Brivio, J., et al, Nano Lett. 11 (2011), p. 5148-5153.Google Scholar
[4] Eda, G., et al, ACS Nano 6 (2012), p. 7311-7317.Google Scholar
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[6] This work was supported in part by C-SPIN, one of the six centers of STARnet, a Semiconductor Research Corporation program, sponsored by MARCO and DARPA and by the NSF under award number DMR-1006706, and the University of Minnesota Graduate School Fellowship. We also acknowledge receiving access to computational resources from the University of Minnesota Supercomputing Institute.Google Scholar