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Determining Projections of Grain Boundaries from Diffraction Data in Transmission Electron Microscope

Published online by Cambridge University Press:  13 April 2016

Ákos K. Kiss  and
János L. Lábár
Ákos K. Kiss
Affiliation:
Hungarian Academy of Sciences, Research Center for Energy Research, Institute for Technical Physics and Materials Science (MTA EK MFA), Konkoly Thege M. út 29-33, H-1121 Budapest, Hungary Doctoral School of Molecular- and Nanotechnologies, Faculty of Information Technology, University of Pannonia, Egyetem u. 10, H-8200 Veszprém, Hungary
János L. Lábár*
Affiliation:
Hungarian Academy of Sciences, Research Center for Energy Research, Institute for Technical Physics and Materials Science (MTA EK MFA), Konkoly Thege M. út 29-33, H-1121 Budapest, Hungary
*
*Corresponding author. [email protected]
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Abstract

Grain boundaries (GB) are characterized by disorientation of the neighboring grains and the direction of the boundary plane between them. A new approach presented here determines the projection of GB that can be used to determine the latter one. The novelty is that an additional parameter of GB is quantified in addition to the ones provided by the orientation maps, namely the width of the projection of the GB is measured from the same set of diffraction patterns that were recorded for the orientation map, without the need to take any additional images. The diffraction patterns are collected in nanobeam diffraction mode in a transmission electron microscope, pixel-by-pixel, from an area containing two neighboring grains and the boundary between them. In our case, the diffraction patterns were recorded using the beam scanning function of a commercially available system (ASTAR). Our method is based on non-negative matrix factorization applied to the mentioned set of diffraction patterns. The method is encoded in a MATLAB environment, making the results easy to interpret and visualize. The measured GB-projection width is used to determine the orientation of the GB-plane, as given in the study by Kiss et al.

Keywords

grain boundary planenon-negative matrix factorizationelectron diffractioncomputer programpolycrystalline thin films
Type
Technique and Instrumentation Development
Information
Microscopy and Microanalysis , Volume 22 , Issue 3 , June 2016 , pp. 551 - 564
Copyright
Copyright © Microscopy Society of America 2016

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