Hostname: page-component-78c5997874-xbtfd Total loading time: 0 Render date: 2024-11-20T01:39:12.416Z Has data issue: false hasContentIssue false
  • English
  • Français

Determination of the Strain Field in Nano-Objects from Aberration-Corrected Z-contrast Images

Published online by Cambridge University Press:  05 August 2007

SI Molina ,
M Varela ,
DL Sales ,
T Ben ,
J Pizarro ,
PL Galindo ,
D Fuster ,
Y Gonzalez ,
L Gonzalez  and
S Pennycook
SI Molina
Affiliation:
University of Cadiz,Spain
M Varela
Affiliation:
Oak Ridge National Laboratory
DL Sales
Affiliation:
University of Cadiz,Spain
T Ben
Affiliation:
University of Cadiz,Spain
J Pizarro
Affiliation:
University of Cadiz,Spain
PL Galindo
Affiliation:
University of Cadiz,Spain
D Fuster
Affiliation:
Institute of Microelectronic of Madrid,Spain
Y Gonzalez
Affiliation:
Institute of Microelectronic of Madrid,Spain
L Gonzalez
Affiliation:
Institute of Microelectronic of Madrid,Spain
S Pennycook
Affiliation:
Oak Ridge National Laboratory
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 746 - 747
Copyright
© 2007 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)