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Determination of the k-Values of Copper-Gold Alloys with ED- and WD-EPMA - Results of an Inter-Laboratory Comparison

Published online by Cambridge University Press:  27 August 2014

Vasile-Dan Hodoroaba
Affiliation:
BAM Federal Institute for Materials Research and Testing, Division 6.8 Surface Analysis and Interfacial Chemistry, 12200 Berlin, Germany
Ryna B. Marinenko
Affiliation:
National Institute of Standards and Technology (NIST), Materials Measurement Science Division,Microanalysis Research Group, Gaithersburg, MD 20899, USA
Vanessa Rackwitz
Affiliation:
BAM Federal Institute for Materials Research and Testing, Division 6.8 Surface Analysis and Interfacial Chemistry, 12200 Berlin, Germany
Wolfram Bremser
Affiliation:
BAM Federal Institute for Materials Research and Testing, Division 1.4 Process Analytical Technology, 12200 Berlin, Germany
Wolfgang E. S. Unger
Affiliation:
BAM Federal Institute for Materials Research and Testing, Division 6.8 Surface Analysis and Interfacial Chemistry, 12200 Berlin, Germany

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Hodoroaba, V-D, Marinenko, R, et al., Microsc. Microanal. 17 (suppl. S2 (2011), p. 856.Google Scholar
[2] ISO/IEC Guide 98-3:2008 Uncertainty of measurement Part 3: Guide to the expression of uncertainty in measurement (GUM:1995), Geneva: Internat. Org. Stds, 101 pp.Google Scholar
[3] All participants in this PS are thanked for their contribution: E Peldszus & G Pelzel (AQura), I Feldmann, G Oder & S Benemann (BAM), R Terborg (Bruker Nano), C Hombourger & M Outrequin (Cameca), J M Juarez (CENAM), I Popov & I Kuselman (INPL), P McSwiggen (McSwiggen & Associates), H Wang (Nim), E Steel & J Small (NIST), L Adlem (NMISA), D Gohil (NPL), S Richter (RWTH Aachen) and L Lindman (SP).Google Scholar