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Determination of the Backscattered Yield Coefficient by Monte Carlo Calculations and Comparison with Experimental Measurements

Published online by Cambridge University Press:  31 July 2006

H Demers  and
R Gauvin
H Demers
Affiliation:
Oak Ridge National Laboratory,McGill University
R Gauvin
Affiliation:
McGill University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 854 - 855
Copyright
© 2006 Microscopy Society of America