Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-27T09:50:42.204Z Has data issue: false hasContentIssue false
  • English
  • Français

Determination of Soft X-ray Emission Spectroscopy Parameters using Experimental Data for Quantitative Microanalysis

Published online by Cambridge University Press:  25 July 2016

Hendrix Demers ,
Colin M. MacRae ,
Nicholas C. Wilson ,
Pierre Hovington ,
Vladimir Timoshevskii ,
Raynald Gauvin  and
Karim Zaghib
Hendrix Demers
Affiliation:
.Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada.
Colin M. MacRae
Affiliation:
.CSIRO Mineral Resources, Clayton, VIC, Australia.
Nicholas C. Wilson
Affiliation:
.CSIRO Mineral Resources, Clayton, VIC, Australia.
Pierre Hovington
Affiliation:
.Hydro-Quebec Research Institute, Varennes, Quebec, Canada.
Vladimir Timoshevskii
Affiliation:
.Hydro-Quebec Research Institute, Varennes, Quebec, Canada.
Raynald Gauvin
Affiliation:
.Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada.
Karim Zaghib
Affiliation:
.Hydro-Quebec Research Institute, Varennes, Quebec, Canada.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 408 - 409
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Burgess, S., Li, X. & Holland, J. Microscopy and Analysis 27 (2013). p S8–S13.Google Scholar
[2] Terauchi, M., et al, Journal of Electron Microscopy 61 (2012). p 1–8.Google Scholar
[3] Hovington, P., et al, Scanning (2016) doi: 10.1002/sca.21302.Google Scholar
[4] Gauvin, R. & Michaud, P. Microscopy and Microanalysis 15 (2009). p 488.Google Scholar
[5] Chantler, C., et al. (2005). [Online] Available: http://physics.nist.gov/ffast.Google Scholar