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Determination of Reliable Grain Boundary Orientation using Automated Crystallographic Orientation Mapping in the Transmission Electron Microscope

Published online by Cambridge University Press:  23 September 2015

Xinming Zhang ,
Jorgen F. Rufner ,
Thomas LaGrange ,
Ricardo H.R. Castro ,
Julie M. Schoenung ,
Geoffrey H. Campell  and
Klaus van Benthem
Xinming Zhang
Affiliation:
Department of Chemical Engineering and Materials Science, University of California, Davis, CA 95616USA
Jorgen F. Rufner
Affiliation:
Department of Chemical Engineering and Materials Science, University of California, Davis, CA 95616USA
Thomas LaGrange
Affiliation:
Physical and Life Sciences Directory, Lawrence Livermore National Laboratory, 7000 East Ave, Livermore, CA 94550USA now at: Ecole Polytechnique Federale de Lausanne, Interdisciplinary Center of Electron Microscopy, 1015 Lausanne, Switzerland
Ricardo H.R. Castro
Affiliation:
Department of Chemical Engineering and Materials Science, University of California, Davis, CA 95616USA
Julie M. Schoenung
Affiliation:
Department of Chemical Engineering and Materials Science, University of California, Davis, CA 95616USA
Geoffrey H. Campell
Affiliation:
Physical and Life Sciences Directory, Lawrence Livermore National Laboratory, 7000 East Ave, Livermore, CA 94550USA
Klaus van Benthem
Affiliation:
Department of Chemical Engineering and Materials Science, University of California, Davis, CA 95616USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1663 - 1664
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Rufner, J, Anderson, D, van Benthem, K & Castro, RHR. J Am Ceram Soc (2013) 96, 2077.Google Scholar
[2] Vogt, R Ultrafine-Grained Aluminm and Boron Carbide Metal Matrix Composites. [S.l.]: Proquest, Umi Dissertatio 2011.Google Scholar
[3] Vogt, R, Zhang, Z, Topping, TD, Lavernia, EJ & Schoenung, JM. J Mater Process Technol (2009) 209, 5046.Google Scholar
[4] Rufner, J.F., Zhang, X., LaGrange, T., Castro, R.H.R., Schoenung, J.M., Campell, G.H. & van Benthem, K. submitted 2015.Google Scholar