Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-26T08:49:17.718Z Has data issue: false hasContentIssue false
  • English
  • Français

Determination of Local Chemistry Composition of Low-Dimensional Semiconductor Nanostructures Through the use of High-Resolution HAADF images

Published online by Cambridge University Press:  23 September 2015

D. Hernandez-Maldonado ,
M. Herrera ,
A.R. Lupini  and
S. I. Molina
D. Hernandez-Maldonado
Affiliation:
Departamento de Ciencia de los Materiales e I.M. y Q.I., Facultad de Ciencias, Universidad de Cadiz, Campus Rio San Pedro, s/n, 11510 Puerto Real, Cadiz, Spain SuperSTEM Laboratory, STFC Daresbury Campus, Daresbury WA4 4AD, UK Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK
M. Herrera
Affiliation:
Departamento de Ciencia de los Materiales e I.M. y Q.I., Facultad de Ciencias, Universidad de Cadiz, Campus Rio San Pedro, s/n, 11510 Puerto Real, Cadiz, Spain
A.R. Lupini
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
S. I. Molina
Affiliation:
Departamento de Ciencia de los Materiales e I.M. y Q.I., Facultad de Ciencias, Universidad de Cadiz, Campus Rio San Pedro, s/n, 11510 Puerto Real, Cadiz, Spain

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2083 - 2084
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Biasiol, G., et al, Physics Reports 500 (2011) 117–173.CrossRefGoogle Scholar
[2] Kadkhodazadeh, S., Micron 44 (2013) 75–92.CrossRefGoogle Scholar
[3] Wang, P., et al, Applied Physics Letters 89 (2006) 072111.CrossRefGoogle Scholar
[4] Van Aert, S., et al, Physical Review B 87 (2013) 064107.CrossRefGoogle Scholar
[5] Molina, S. I., et atl, Ultramicroscopy 109 (2009) 172–176.CrossRefGoogle Scholar
[6] Galindo, P.L., Journal of Physics 522 (2014) 012013.Google Scholar
[7] Grieb, T., Ultramicroscopy 129 (2013) 1–9.CrossRefGoogle Scholar
[8] This research was supported by the Spanish MINECO (project TEC2011-29120-C05-03 and CONSOLIDER INGENIO CSD2009-00013) and the Junta de Andalucia (PAI research group TEP-946 INNANOMAT). Co-funding from UE is also acknowledged. Work at Oak Ridge National Laboratory was sponsored by the U.S. Department of Energy, Division of Materials Sciences and Engineering. We thank L. Gonzalez and Y. Gonzalez from IMM for supplying the sample.Google Scholar