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Detection of Noise Level and Resonance Frequency Shifting Through of Principal Component Analysis (PCA) in Simulated Dataset of Band Excitation Scanning Probe Microscopy (BE-SPM)

Published online by Cambridge University Press:  01 August 2018

Carlos Andres Rosero-Zambrano  and
Francy Basante
Carlos Andres Rosero-Zambrano
Affiliation:
South Colombian International Logistics Center, Servicio Nacional de Aprendizaje (National Apprentice Service) - SENA, Tecnoacademia, Tuquerres, Colombia.
Francy Basante
Affiliation:
South Colombian International Logistics Center, Servicio Nacional de Aprendizaje (National Apprentice Service) - SENA, Tecnoacademia, Tuquerres, Colombia.

Abstract

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Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 596 - 597
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Rodriguez, B. J., et al in "Scanning Probe Microscopy of Functional Materials". Springer New York p 491.Google Scholar
[2] Jesse, S. Kalinin, S. V Nanotechnology 20(8 2009) p 85714.Google Scholar
[3] Trauth, M. H. in "MATLAB® Recipes for Earth Sciences, Berlin, Heidelberg". Springer Berlin p 375.Google Scholar