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Detecting and Characterizing the Fluxionality in Pt Nanoparticles

Published online by Cambridge University Press:  22 July 2022

Advait Gilankar ,
Benjamin K. Miller ,
Adrià Marcos Morales ,
Piyush Haluai ,
Mai Tan ,
Joshua L. Vincent ,
Carlos Fernandez-Granda  and
Peter A. Crozier
Advait Gilankar*
Affiliation:
Arizona State University, Tempe, AZ, United States
Benjamin K. Miller
Affiliation:
Gatan, Inc. Pleasanton, CA, United States
Adrià Marcos Morales
Affiliation:
New York University, New York, United States
Piyush Haluai
Affiliation:
Arizona State University, Tempe, AZ, United States
Mai Tan
Affiliation:
Arizona State University, Tempe, AZ, United States
Joshua L. Vincent
Affiliation:
Arizona State University, Tempe, AZ, United States
Carlos Fernandez-Granda
Affiliation:
New York University, New York, United States
Peter A. Crozier
Affiliation:
Arizona State University, Tempe, AZ, United States
*
*Corresponding author: [email protected]

Abstract

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Type
Beyond Visualization with In Situ and Operando TEM
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 166 - 168
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Copyright
Copyright © Microscopy Society of America 2022

References

Vincent, JL et al. , Nature Communications 12 (2021), p. 5789.CrossRefGoogle Scholar
Lu, Y et al. , ChemCatChem (12)6, pg. 1726.CrossRefGoogle Scholar
Ye, X et al. , Nano Research (12)6 (2019), p. 1401.CrossRefGoogle Scholar
Lawrence, EL et al. , ACS Nano (15)2 (2021), p. 2624.CrossRefGoogle Scholar
Manzorro, R et al. , Microscopy and Microanalysis 27(S1), p. 1306.CrossRefGoogle Scholar
Vincent, JL et al. , Microscopy and Microanalysis (27)6, p. 1431.CrossRefGoogle Scholar
Perry, MB in “Wiley Encyclopedia of Operations Research and Management Science” (2010).Google Scholar
Sheth, DY et al. arXiv:2011.15045v3 [eess.IV]Google Scholar
We gratefully acknowledge the support of the following NSF grants (OAC 1940263, OAC 1940097, CBET 1604971 and DMR 184084). We also acknowledge the support from DOE grant BES DE-SC0004954. The authors acknowledge HPC resources available through ASU, and NYU as well as the John M. Cowley Center for High Resolution Electron Microscopy at Arizona State.Google Scholar