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Design of an Electron Optical System for the Correction of the Chromatic Aberration Cc of a TEM Objective Lens

Published online by Cambridge University Press:  01 August 2004

Max Haider
Affiliation:
CEOS, Germany
Heiko Müller
Affiliation:
CEOS, Germany
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Extract

Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.

Type
Research Article
Copyright
© 2004 Microscopy Society of America

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