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The Design and First Results of a Dedicated Corrector (S)TEM.

Published online by Cambridge University Press:  01 August 2005

M A van der Stam ,
P Tiemeijer ,
B Freitag ,
M Stekelenburg  and
J Ringnalda
M A van der Stam
Affiliation:
FEI,The Netherlands
P Tiemeijer
Affiliation:
FEI,The Netherlands
B Freitag
Affiliation:
FEI,The Netherlands
M Stekelenburg
Affiliation:
FEI,The Netherlands
J Ringnalda
Affiliation:
FEI,The Netherlands

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 2148 - 2149
Copyright
© 2005 Microscopy Society of America