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Depth Resolved Measurements of Atomic Scale Defects in Ion Irradiated Fe Alloys

Published online by Cambridge University Press:  05 August 2019

F. A. Selim*
Affiliation:
Department of Physics and Astronomy, Bowling Green State University, Bowling Green, Ohio 43403, USA. Center for Pure and Applied Photosciences, Bowling Green State University, Bowling Green, Ohio 43403, USA.
S. Agarwal
Affiliation:
Department of Physics and Astronomy, Bowling Green State University, Bowling Green, Ohio 43403, USA. Center for Pure and Applied Photosciences, Bowling Green State University, Bowling Green, Ohio 43403, USA.
M. O. Liedke
Affiliation:
Institute of Radiation Physics, Helmholtz-Center Dresden-Rossendorf, Dresden 01328, Germany.
M. Butterling
Affiliation:
Institute of Radiation Physics, Helmholtz-Center Dresden-Rossendorf, Dresden 01328, Germany.
A. Wagner
Affiliation:
Institute of Radiation Physics, Helmholtz-Center Dresden-Rossendorf, Dresden 01328, Germany.
P. Hosemann
Affiliation:
Department of Nuclear Engineering, University of California at Berkeley, Berkeley, CA 94720, USA.
N. Li
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA.
Y. Wang
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA.
B. P. Uberuaga
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA.
*
*Corresponding author: [email protected]

Abstract

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Type
Microscopy and Microanalysis of Nuclear and Irradiated Materials
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Krause-Rehberg, R, Leipner, HS. Positron annihilation in semiconductors: defect studies. Springer Science & Business Media; 1999.Google Scholar
The work was funded as part of FUTURE, an energy frontier research center funded by DOE, Office of Basic Energy Sciences.Google Scholar