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Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study

Published online by Cambridge University Press:  23 November 2012

N. Alem ,
S. Louie ,
A. Zettl ,
Q. Ramasse ,
O. Yazyev ,
C. Seabourne ,
A. Scott ,
C. Kisielowski ,
P. Hartel  and
B. Jiang
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N. Alem
Affiliation:
UC Berkeley, Berkeley, CA
S. Louie
Affiliation:
UC Berkeley, Berkeley, CA
A. Zettl
Affiliation:
UC Berkeley, Berkeley, CA
Q. Ramasse
Affiliation:
SuperSTEM Laboratory, Daresbury, United Kingdom
O. Yazyev
Affiliation:
Institute of Theoretical Physics, EPFL, Lausanne, Switzerland
C. Seabourne
Affiliation:
Institute for Materials Research, SPEME, University of Leeds, Leeds, United Kingdom
A. Scott
Affiliation:
Institute for Materials Research, SPEME, University of Leeds, Leeds, United Kingdom
C. Kisielowski
Affiliation:
National Center for Electron microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA
P. Hartel
Affiliation:
CEOS, Heidelberg, Germany
B. Jiang
Affiliation:
FEI Company, Hillsboro, OR
R. Erni
Affiliation:
Empa, Duebendorf, Switzerland
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1516 - 1517
Copyright
Copyright © Microscopy Society of America 2012

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