Hostname: page-component-cc8bf7c57-pd9xq Total loading time: 0 Render date: 2024-12-12T02:06:40.094Z Has data issue: false hasContentIssue false
  • English
  • Français

Defect Analysis of Single Crystal Synthetic Diamond

Published online by Cambridge University Press:  01 August 2018

Jafar F. Al-Sharab ,
S.D. Tse  and
B.H. Kear
Jafar F. Al-Sharab
Affiliation:
Department of Engineering Technology, Northwestern State University, Natchitoches, LA, USA
S.D. Tse
Affiliation:
Department of Mechanical and Aerospace Engineering, Rutgers University, Piscataway, NJ, USA
B.H. Kear
Affiliation:
Department of Mechanical and Aerospace Engineering, Rutgers University, Piscataway, NJ, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1766 - 1767
Copyright
© Microscopy Society of America 2018 

References

Reference:

[1] Pan, L. S. Kania, D. R. Diamond: Electronic Properties and Applications.. London: Springer 1995.Google Scholar
[2] Ueda, K., et al, IEEE Electron Dev. Lett. 27 2006) p 570.Google Scholar