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Defect Analysis in La0.7Sr0.3MnO3 Epitaxial Thin Films by Electron Channeling Contrast Imaging (ECCI)

Published online by Cambridge University Press:  27 August 2014

Miaolei Yan ,
Marc De Graef ,
Yoosuf N. Picard  and
Paul A. Salvador
Miaolei Yan
Affiliation:
Dept. of Materials Science and Engr., Carnegie Mellon University, Pittsburgh, PA 15213, USA
Marc De Graef
Affiliation:
Dept. of Materials Science and Engr., Carnegie Mellon University, Pittsburgh, PA 15213, USA
Yoosuf N. Picard
Affiliation:
Dept. of Materials Science and Engr., Carnegie Mellon University, Pittsburgh, PA 15213, USA
Paul A. Salvador
Affiliation:
Dept. of Materials Science and Engr., Carnegie Mellon University, Pittsburgh, PA 15213, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1036 - 1037
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Kamaladasa, R.J., Liu, F., Porter, L.M., Davis, R.F., Koleske, D.D., Mulholland, G., Jones, K.S. & Picard, Y.N. Journal of Microscopy 244, 311 2011.Google Scholar
[2] Kamaladasa, R.J. & Jiang, W., and Picard, Y.N. Journal of Electronic Material 40, 2222 2011.Google Scholar
[3] Yan, L.and Salvador, P.A. ACS Applied Materials & Interfaces 4, 2541 2012.Google Scholar
[4] Santiso, J., Balcells, L., Konstantinovic, Z., Roqueta, J., Ferrer, P., Pomar, A., Martínez,and, B. & Sandiumenge, F. CrystEngComm 15, 3908 2013.Google Scholar