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A Dedicated In-situ Off-axis Electron Holography (S)TEM: Concept and Electron-Optical Performance.

Published online by Cambridge University Press:  27 August 2014

Felix Börrnert ,
Thomas Riedel ,
Heiko Müller ,
Martin Linck ,
Bernd Büchner  and
Hannes Lichte
Felix Börrnert
Affiliation:
Speziallabor Triebenberg, Technische Universität Dresden, 01062 Dresden, Germany IFW Dresden, PF 270116, 01171 Dresden, Germany
Thomas Riedel
Affiliation:
CEOS GmbH, Englerstraße 28, 69126 Heidelberg, Germany
Heiko Müller
Affiliation:
CEOS GmbH, Englerstraße 28, 69126 Heidelberg, Germany
Martin Linck
Affiliation:
CEOS GmbH, Englerstraße 28, 69126 Heidelberg, Germany
Bernd Büchner
Affiliation:
IFW Dresden, PF 270116, 01171 Dresden, Germany
Hannes Lichte
Affiliation:
Speziallabor Triebenberg, Technische Universität Dresden, 01062 Dresden, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1650 - 1651
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Freitag, B, et al, Microscopy and Microanalysis , 2009) p. 184.Google Scholar
[2] Lichte, H, et al, Ultramicroscopy 134 (2013), p. 126.Google Scholar
[3] Tanigaki, T, et al, Applied Physics Letters 101 (2012), p. 043101.Google Scholar
[4] Linck, M, et al, Microscopy and Microanalysis (2010) p. 94.Google Scholar
[5] Börrnert, F, et al, Journal of Microscopy 249 (2013), p. 87.Google Scholar
[6] The authors acknowledge financial support from the European Union under the Seventh Framework Programme under a contract for an Integrated Infrastructure Initiative (Reference 312483—ESTEEM2). We thank Prof. A. Kirkland (University of Oxford) for providing the SE detector.Google Scholar