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De-coupling Anelastic and Elastic Deformation in Metallic Glass Thin Films via Measurement of Micro Strain Tensors Using in situ Electron Diffraction

Published online by Cambridge University Press:  25 July 2016

Rohit Sarkar
Affiliation:
School of Engineering for Matter, Transport and Energy, Arizona State University, Tempe. USA
Christian Ebner
Affiliation:
Physics of Nanostructured Materials, Faculty of Physics, University of Vienna, Vienna, Austria
Christian Rentenberger
Affiliation:
Physics of Nanostructured Materials, Faculty of Physics, University of Vienna, Vienna, Austria
Jagannathan Rajagopalan
Affiliation:
School of Engineering for Matter, Transport and Energy, Arizona State University, Tempe. USA

Abstract

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Abstract
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Béché, A., Rouvière, J.L., Barnes, J.P. & Cooper, D. Ultramicroscopy 131 (2013) 1023.CrossRefGoogle Scholar
[2] Hüe, F., Hӱtch, M., Bender, H., Houdellier, F. & Claverie, A. Phys. Rev. Lett 100 (2008) 156602.Google Scholar
[3] Béché, A., Rouvière, J.L., Barnes, J.P. & Cooper, D. Ultramicroscopy 111 (2011) 227238.Google Scholar
[4] Usuda, K., Numata, T., Irisawa, T., Hirashita, N. & Takagi, S. Materials Science and Engineering: B 124–125 (2005) 143147.CrossRefGoogle Scholar
[5] Clément, L., Pantel, R., Kwakman, L.F.T. & Rouvière, J.L. Applied Physics Letters 85 (2004) 651653.Google Scholar
[6] Poulsen, H.F., Wert, J.A., Neuefeind, J., Honkimäki, V. & Daymond, M. Nat Mater 4 (2005) 3336.Google Scholar
[7] Ebner, C., Sarkar, R., Rajagopalan, J. & Rentenberger, C. Ultramicroscopy. In Review (2016).Google Scholar
[8] Han, J.H. & Saif, M.T.A. Review of Scientific Instruments 77 (2006) 045102.CrossRefGoogle Scholar
[9] This project was funded by the National Science Foundation (NSF) grants ECCS 1102201, CMMI 1400505 and DMR 1454109. The authors would like to gratefully acknowledge the use of facilities at the John M. Cowley Centre for High Resolution Electron Microscopy and the Centre for Solid State Electronics Research at Arizona State University and at the Faculty of Physics of the University of Vienna. Financial support from the Austrian Science Fund (FWF): [P22440, I1309] is acknowledged.Google Scholar