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Deconvolution Method Used in Improving the Depth Resolution of Three-Dimensional Images Taken by Scanning Confocal Electron Microscopy

Published online by Cambridge University Press:  01 August 2010

X Zhang ,
M Takeguchi ,
A Hashimoto ,
K Mitsuishi  and
M Shimojo
X Zhang
Affiliation:
Saitama Institute of Technology, Japan
M Takeguchi
Affiliation:
National Institute for Materials Science, Japan
A Hashimoto
Affiliation:
National Institute for Materials Science, Japan
K Mitsuishi
Affiliation:
National Institute for Materials Science, Japan
M Shimojo
Affiliation:
Saitama Institute of Technology, Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 290 - 291
Copyright
Copyright © Microscopy Society of America 2010