Current State of Combined EDS-WDS Quantitative X-Ray Mapping

Ken Moran; Richard Wuhrer

doi:10.1017/S1431927616001318

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References

[1] Moran, K. & Wuhrer, R. “Quantitative Bulk and Trace Element X-Ray Mapping Using Multiple Detectors”. Mikrochimica Acta Vol. 155, pp. 59–66, 2006.Google Scholar

[2] Wuhrer, R. & Moran, K. “Dedicated X-Ray Mapping System with Single and Multiple SDD Detectors for Quantitative X-Ray Mapping and Data Processing-ray Mapping and Chemical Phase Mapping with an Amptek SDD”,. Microsc. Microanal 21(Suppl 3 (2015) p2191–2192.Google Scholar

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Wuhrer, Richard and Moran, Ken 2017. Incorporation of an Amptek Silicon Drift Detector into a Wavelength Dispersive Spectrometer (WDS) Replacing the Gas Flow Proportional Counter. Microscopy and Microanalysis, Vol. 23, Issue. S1, p. 1048.

Wuhrer, R and Moran, K 2018. A new life for the wavelength-dispersive X-ray spectrometer (WDS): incorporation of a silicon drift detector into the WDS for improved quantification and X-ray mapping. IOP Conference Series: Materials Science and Engineering, Vol. 304, Issue. , p. 012021.

Moran, Ken and Wuhrer, Richard 2018. SD-WDS Second Order Bremsstrahlung and Peak to Background Ratios. Microscopy and Microanalysis, Vol. 24, Issue. S1, p. 756.

Moran, Ken and Wuhrer, Richard 2019. SD-WDS: Bremsstrahlung Determination by Theoretical Calculation and Subsequent Estimation of Mass Attenuation Coefficients. Microscopy and Microanalysis, Vol. 25, Issue. S2, p. 2316.

Ritchie, Nicholas W. M. 2020. Embracing Uncertainty: Modeling the Standard Uncertainty in Electron Probe Microanalysis—Part I. Microscopy and Microanalysis, Vol. 26, Issue. 3, p. 469.

Wuhrer, Richard and Moran, Ken 2020. Reasons to Replace a Proportional Counter (PC) in the Wavelength Dispersive Spectrometer (WDS) with a Silicon Drift Detector (SDD). Microscopy and Microanalysis, Vol. 26, Issue. S2, p. 768.

Wuhrer, Richard Moran, Ken and Matthews, Michael 2023. WDS-SD: Next Generation of Wavelength Dispersive Spectrometers (WDS) with a Silicon Drift Detector (SDD) – What Can it Do, Where Are We Now and Where is It Going?. Microscopy and Microanalysis, Vol. 29, Issue. Supplement_1, p. 846.

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Current State of Combined EDS-WDS Quantitative X-Ray Mapping

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