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Current Developments of Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

Published online by Cambridge University Press:  23 November 2012

P. Wang ,
A.I. Kirkland ,
P.D. Nellist ,
A.J. D’Alfonso ,
A.J. Morgan ,
L.J. Allen ,
A. Hashimoto ,
M. Takeguchi ,
K. Mitsuishi  and
M. Shimojo
P. Wang
Affiliation:
Nanjing University, Nanjing, Jiangsu, China
A.I. Kirkland
Affiliation:
University of Oxford, Oxford, Oxfordshire, United Kingdom
P.D. Nellist
Affiliation:
University of Oxford, Oxford, Oxfordshire, United Kingdom
A.J. D’Alfonso
Affiliation:
University of Melbourne, Melbourne, Victoria, Australia
A.J. Morgan
Affiliation:
University of Melbourne, Melbourne, Victoria, Australia
L.J. Allen
Affiliation:
University of Melbourne, Melbourne, Victoria, Australia
A. Hashimoto
Affiliation:
National Institute for Materials Science, Sakura, Tsukuba, Japan
M. Takeguchi
Affiliation:
National Institute for Materials Science, Sakura, Tsukuba, Japan
K. Mitsuishi
Affiliation:
National Institute for Materials Science, Sakura, Tsukuba, Japan
M. Shimojo
Affiliation:
Shibaura Institute of Technology, Tokyo, Tokyo, Japan
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 532 - 533
Copyright
Copyright © Microscopy Society of America 2012

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