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Coupling Electronic Holography and Finite-Element Method Simulations to Measure Electric Fields in Nanocapacitors.

Published online by Cambridge University Press:  22 July 2022

Kilian Gruel ,
Raphaël Serra ,
Leifeng Zhang ,
Aurélien Masseboeuf ,
Martin J. Hÿtch  and
Christophe Gatel
Kilian Gruel
Affiliation:
CEMES-CNRS, Toulouse, France
Raphaël Serra
Affiliation:
CEMES-CNRS, Toulouse, France
Leifeng Zhang
Affiliation:
CEMES-CNRS, Toulouse, France
Aurélien Masseboeuf
Affiliation:
CEMES-CNRS, Toulouse, France
Martin J. Hÿtch*
Affiliation:
CEMES-CNRS, Toulouse, France
Christophe Gatel
Affiliation:
CEMES-CNRS, Toulouse, France Université de Toulouse, Toulouse, France
*
*Corresponding author: [email protected]

Abstract

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Type
Insights into Phase Transitions in Functional Materials by In Situ/Operando TEM: Experiment Meets Theory
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2278 - 2280
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Copyright
Copyright © Microscopy Society of America 2022

References

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This work was supported by the French national project IODA (ANR-17-CE24-0047). The research leading to these results has received funding from the European Union Horizon 2020 research and innovation programme under grant agreement No. 823717 – ESTEEM3.Google Scholar