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Coupling Electronic Holography and Finite-Element Method Simulations to Measure Electric Fields in Nanocapacitors.
Published online by Cambridge University Press: 22 July 2022
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- Type
- Insights into Phase Transitions in Functional Materials by In Situ/Operando TEM: Experiment Meets Theory
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- Copyright © Microscopy Society of America 2022
References
Twitchett, AC, Dunin-Borkowski, RE and Midgley, PA, Phys. Rev. Lett. 88 (2002), p. 238302. doi: 10.1103/PhysRevLett.88.238302CrossRefGoogle Scholar
Yazdi, S, Kasama, T, Beleggia, M, Yekta, MS, McComb, DW, Twitchett-Harrison, AC and Dunin-Borkowski, RE 152 (2015), p. 10. doi: 10.1016/j.ultramic.2016.07.016CrossRefGoogle Scholar
Gatel, C et al. , Nano Lett. vol. 15 no 10 (2015), p. 6952-6957. doi: 10.1021/acs.nanolett.5b02892CrossRefGoogle Scholar
Hÿtch, M, Houdellier, F, Hüe, F, et Snoeck, E, Nature vol. 453 no 7198 (2008), p. 1086-1089. doi: 10.1038/nature07049CrossRefGoogle Scholar
Duchamp, M et al. , Resolut. Discov. vol. 1 no 1 (2016), p. 27-33. doi: 10.1556/2051.2016.00036CrossRefGoogle Scholar
Gatel, C, Dupuy, J, Houdellier, F, et Hÿtch, MJ, Appl. Phys. Lett. vol. 113 no 13 (2018), p. 133102. doi: 10.1063/1.5050906CrossRefGoogle Scholar
Virtanen, P et al. , Nature Methods vol. 17 no 3 (2020), p. 261-272. doi: 10.1038/s41592-019-0686-2CrossRefGoogle Scholar
Branch, MA et al. , SIAM J. Sci. Comput. Vol. 21 No. 1 (1999), pp. 1–23. doi: 10.1137/S1064827595289108Google Scholar
This work was supported by the French national project IODA (ANR-17-CE24-0047). The research leading to these results has received funding from the European Union Horizon 2020 research and innovation programme under grant agreement No. 823717 – ESTEEM3.Google Scholar
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