Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-26T08:46:07.990Z Has data issue: false hasContentIssue false
  • English
  • Français

Correlative Tomography - Bridging the length-scales through correlative X-ray and Electron Imaging

Published online by Cambridge University Press:  30 July 2021

Philip Withers ,
Jack Donoghue  and
Timothy Burnett
Philip Withers
Affiliation:
University of Manchester, Manchester, England, United Kingdom
Jack Donoghue
Affiliation:
University of Manchester, Manchester, England, United Kingdom
Timothy Burnett
Affiliation:
The University of Manchester, Manchester, United Kingdom

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Nanoscale x-ray and Electron Microscopy Techniques and Applications in Material Science
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 932 - 933
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Echlin, M.P., et al. , Serial sectioning in the SEM for three dimensional materials science. Current Opinion in Solid State and Materials Science, 2020. 24(2): p. 100817.CrossRefGoogle Scholar
Withers, P.J. and Burnett, T.L., Rich multi-dimensional correlative imaging. IOP Conference Series: Materials Science and Engineering, 2019. 580: p. 012014.Google Scholar