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Correlative Spectromicroscopy and Tomography Involving Soft X-ray Methods

Published online by Cambridge University Press:  01 August 2018

Adam P. Hitchcock ,
Xiaoyue Wang  and
Kathryn Grandfield
Adam P. Hitchcock
Affiliation:
Chemistry and Chemical Biology, McMaster University, Hamilton, Canada
Xiaoyue Wang
Affiliation:
Materials Science and Engineering, McMaster University, Hamilton, Canada
Kathryn Grandfield
Affiliation:
Materials Science and Engineering, McMaster University, Hamilton, Canada

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 364 - 365
Copyright
© Microscopy Society of America 2018 

References

[1] Branemark, R., et al, J. Rehabil. Res. Dev 38 2001) p. 175.Google Scholar
[2] Wang, X., et al Advanced Materials Interfaces (2018) in review.Google Scholar
[3] Zhu, X., et al, Geomicrobiology Journal 35 2018) p. 215.Google Scholar
[4] ET, TEM-EELS and APT acquired at the Canadian Centre for Electron Microscopy (McMaster). STXM acquired at the Canadian Light Source, supported by CFI. Research funded by NSERC.Google Scholar