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Correlative SEM and Raman imaging of hot spots on SERS substrate

Published online by Cambridge University Press:  23 September 2015

R. Vana ,
M. Kocman  and
J. Jiruse
R. Vana
Affiliation:
TESCAN Brno, s.r.o., Libusina trida 1, Brno, Czech Republic
M. Kocman
Affiliation:
TESCAN Brno, s.r.o., Libusina trida 1, Brno, Czech Republic
J. Jiruse
Affiliation:
TESCAN Brno, s.r.o., Libusina trida 1, Brno, Czech Republic

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 153 - 154
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Jiruse, J, etal., Journal of Vac. Sci. Technol. B 32 (2014) 06FC03.CrossRefGoogle Scholar
[2] Stolcova, L, et al., Proceedings of Progr. in Elmag. Res. Symp. (PIERS), Stockholm (2013), 426.Google Scholar
[3] Jiruse, J, et al., Microsc. Microanal 19 Suppl. 2 (2013) 1302.CrossRefGoogle Scholar
[4] The research leading to these results has received funding from the European Union 7th Framework Program [FP7/2007-2013] under grant agreement n°280566, project UnivSEM.Google Scholar