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Correlative nanoscopy: super resolved fluorescence and atomic force microscopy towards nanoscale manipulation and multimodal investigations

Published online by Cambridge University Press:  23 September 2015

Alberto Diaspro
Affiliation:
Istituto Italiano di Tecnologia, Nanoscopy and Nikon Imaging Center, Genova, Italy Department of Physics, University of Genoa, Genova, Italy
Jenu Chacko
Affiliation:
Istituto Italiano di Tecnologia, Nanoscopy and Nikon Imaging Center, Genova, Italy Biomedical Engineering Department, University of California, Irvine, United States
Francesca Cella Zanacchi
Affiliation:
Istituto Italiano di Tecnologia, Nanoscopy and Nikon Imaging Center, Genova, Italy Department of Physics, University of Genoa, Genova, Italy
Reiner Oropesa
Affiliation:
Istituto Italiano di Tecnologia, Nanoscopy and Nikon Imaging Center, Genova, Italy Department of Physics, University of Genoa, Genova, Italy
Silvia Dante
Affiliation:
Istituto Italiano di Tecnologia, Nanoscopy and Nikon Imaging Center, Genova, Italy
Claudio Canale
Affiliation:
Istituto Italiano di Tecnologia, Nanoscopy and Nikon Imaging Center, Genova, Italy

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

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[3] Diaspro, A., Il Nuovo Saggiatore 30 (2014). p 45.Google Scholar
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