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Correlative Microscopy Using TEM and SIMS: Parallel Ion Electron Spectrometry (PIES) for High-Resolution, High-Sensitivity Elemental Mapping for Applications in Materials Science and Biology

Published online by Cambridge University Press:  27 August 2014

Santhana Eswara Moorthy ,
David Dowsett  and
Tom Wirtz

Abstract

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Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 970 - 971
Copyright
Copyright © Microscopy Society of America 2014 

References

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