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Correlative Fractography: Combining Scanning Electron Microscopy and Light Microscopes for Qualitative and Quantitative Analysis of Fracture Surfaces

Published online by Cambridge University Press:  12 February 2013

Luis Rogerio de Oliveira Hein ,
José Alberto de Oliveira  and
Kamila Amato de Campos
Luis Rogerio de Oliveira Hein*
Affiliation:
UNESP—Univ Estadual Paulista, DMT—Department of Materials and Technology, LAIMat—Materials Imaging Laboratory, Av. Ariberto Pereira da Cunha, 333, Guaratinguetá, SP, 12.516-410, Brazil
José Alberto de Oliveira
Affiliation:
UNESP—Univ Estadual Paulista, DMT—Department of Materials and Technology, LAIMat—Materials Imaging Laboratory, Av. Ariberto Pereira da Cunha, 333, Guaratinguetá, SP, 12.516-410, Brazil
Kamila Amato de Campos
Affiliation:
UNESP—Univ Estadual Paulista, DMT—Department of Materials and Technology, LAIMat—Materials Imaging Laboratory, Av. Ariberto Pereira da Cunha, 333, Guaratinguetá, SP, 12.516-410, Brazil
*
*Corresponding author. E-mail: [email protected]
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Abstract

Correlative fractography is a new expression proposed here to describe a new method for the association between scanning electron microscopy (SEM) and light microscopy (LM) for the qualitative and quantitative analysis of fracture surfaces. This article presents a new method involving the fusion of one elevation map obtained by extended depth from focus reconstruction from LM with exactly the same area by SEM and associated techniques, as X-ray mapping. The true topographic information is perfectly associated to local fracture mechanisms with this new technique, presented here as an alternative to stereo-pair reconstruction for the investigation of fractured components. The great advantage of this technique resides in the possibility of combining any imaging methods associated with LM and SEM for the same observed field from fracture surface.

Keywords

quantitative fractographylight microscopyscanning electron microscopyimage processingextended depth from focus reconstructioncorrelative microscopy
Type
Software, Techniques, and Equipment Development: Short Communications
Information
Microscopy and Microanalysis , Volume 19 , Issue 2 , April 2013 , pp. 496 - 500
Copyright
Copyright © Microscopy Society of America 2013

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References

Agronskaia, A.V., Valentijn, J.A., Driel, L.F., Schneijdenberg, C.T.W.M., Humbel, B.M., Henegouwen, P.M.P.B., Verkleij, A.J., Koster, A.J. & Gerritsen, H.C. (2008). Integrated fluorescence and transmission electron microscopy. J Struct Biol 164, 183–189.Google Scholar
Caltabiano, P.C.R.O., Rosa, P.H.S., Campos, K.A. & Hein, L.R.O. (2012). Extended depth from focus reconstruction method for stretch zone measurement in 15-5PH steel. Microsc Res Tech 75, 1155–1158.Google Scholar
Chapman, S.K. (1999). Optimising the performance of a tungsten hairpin scanning electron microscope. Scanning Microscopy 13, 141–146.Google Scholar
Hein, L.R.O. (2001). Quantitative fractography by digital image processing: NIH Image macro tools for stereo pair analysis and 3-D reconstruction. J Microsc 204, 17–28.Google Scholar
Joy, D.C. & Joy, C.S. (1996). Low voltage scanning electron microscopy. Micron 27, 247–263.Google Scholar
Kang, K.W., Pereda, M.D., Canafoglia, M.E., Bilmes, P., Llorente, C. & Bonetto, R.D. (2012). Uncertainty studies of topographical measurements on steel surface corrosion by 3D scanning electron microscopy. Micron 43, 387–395.Google Scholar
Plitzko, J.M., Rigort, A. & Leis, A. (2009). Correlative cryo-light microscopy and cryo-electron tomography: From cellular territories to molecular landscapes. Current Opin Biotechnol 20, 83–89.Google Scholar
Rasband, W.S. (2012). ImageJ. Bethesda, MD: U.S. National Institutes of Health. Available at http://imagej.nih.gov/ij.Google Scholar
Sartori, A., Gatz, R., Beck, F., Rigort, A., Baumeister, W. & Plitzko, J.M. (2007). Correlative microscopy: Bridging the gap between fluorescence light microscopy and cryo-electron tomography. J Struct Biol 160, 135–145.Google Scholar
Verkade, P. (2008). Moving EM: The Rapid Transfer System as a new tool for correlative light and electron microscopy and high throughput for high-pressure freezing. J Microsc 230, 317–328.Google Scholar
Vicidomini, G., Gagliani, M.C., Cortese, K., Krieger, J., Buescher, P., Bianchini, P., Boccacci, P., Tacchetti, C. & Diaspro, A. (2010). A novel approach for correlative light electron microscopy analysis. Microsc Res Techniq 73, 215–224.Google Scholar