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Correlative Electron Microscopy Enables Scalable Characterization of 2D half-van der Waals Heterostructures

Published online by Cambridge University Press:  30 July 2021

Hesham El-Sherif ,
Natalie Briggs ,
Joshua Robinson  and
Nabil Bassim
Hesham El-Sherif
Affiliation:
McMaster University, Hamilton, Ontario, Canada
Natalie Briggs
Affiliation:
The Pennsylvania State University, State College, Pennsylvania, United States
Joshua Robinson
Affiliation:
The Pennsylvania State University, State College, Pennsylvania, United States
Nabil Bassim
Affiliation:
Department of Materials Science and Engineering, McMaster University, Hamilton, Ontario, Canada, Hamilton, Ontario, Canada

Abstract

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Type
Emerging Low-Dimensional Nanomaterials and Their Heterostructures
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 636 - 638
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Briggs, N., Bersch, B., Wang, Y., Jiang, J., Koch, R. J., Nayir, N., Wang, K., Kolmer, M., Ko, W., De La Fuente Duran, A., Subramanian, S., Dong, C., Shallenberger, J., Fu, M., Zou, Q., Chuang, Y. W., Gai, Z., Li, A. P., Bostwick, A., Jozwiak, C., Chang, C. Z., Rotenberg, E., Zhu, J., van Duin, A. C. T., Crespi, V., Robinson, J. A., Nature Materials 2020, 19, 637.CrossRefGoogle Scholar
Steves, M. A., Wang, Y., Briggs, N., Zhao, T., El-Sherif, H., Bersch, B. M., Subramanian, S., Dong, C., Bowen, T., Fuente Duran, A. D. L., Nisi, K., Lassaunière, M., Wurstbauer, U., Bassim, N. D., Fonseca, J., Robinson, J. T., Crespi, V. H., Robinson, J., Knappenberger, K. L. Jr, Nano Letters 2020, 20, 8312.CrossRefGoogle Scholar
Nisi, K., Subramanian, S., He, W., Ulman, K. A., El-Sherif, H., Sigger, F., Lassaunière, M., Wetherington, M. T., Briggs, N., Gray, J., Holleitner, A. W., Bassim, N., Quek, S. Y., Robinson, J. A., Wurstbauer, U., Advanced Functional Materials 2020, 2005977.Google Scholar