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Correlative Electron Energy-Loss Spectroscopy Bandgap Mapping and DFT Modeling in AlGaN Diodes

Published online by Cambridge University Press:  22 July 2022

Julia I. Deitz ,
Joshua D. Sugar ,
Boris Kiefer ,
Nicholas S. Baldonado ,
Andrew A. Allerman  and
Mary H. Crawford
Julia I. Deitz*
Affiliation:
Sandia National Laboratories, Albuquerque, NM, United States
Joshua D. Sugar
Affiliation:
Sandia National Laboratories, Livermore, CA, United States
Boris Kiefer
Affiliation:
New Mexico State University, Las Cruces, NM, United States
Nicholas S. Baldonado
Affiliation:
New Mexico State University, Las Cruces, NM, United States
Andrew A. Allerman
Affiliation:
Sandia National Laboratories, Albuquerque, NM, United States
Mary H. Crawford
Affiliation:
Sandia National Laboratories, Albuquerque, NM, United States
*
*Corresponding author: [email protected]

Abstract

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Type
Nanoscale Optics with Electrons and Photons
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2010 - 2011
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Copyright
Copyright © Microscopy Society of America 2022

References

Rafferty, B and Brown, LM, Phys. Rev. B 58 (1998), p. 10326.CrossRefGoogle Scholar
Lazar, S et al. , Ultramicosc. 96 (2003), p. 535.CrossRefGoogle Scholar
This work was supported by the Laboratory Directed Research and Development program at Sandia National Laboratories, a multimission laboratory managed and operated by National Technology and Engineering Solutions of Sandia LLC, a wholly owned subsidiary of Honeywell International Inc. for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-NA0003525Google Scholar