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Correlative 3D X-Ray, Laser Ablation, and SEM/EDS Mapping Establishing Access Point for FIB Tomography of Defects in Multi-Layer Ceramic Capacitors

Published online by Cambridge University Press:  05 August 2019

J Favata ,
V Ray  and
S Shahbazmohamadi
J Favata
Affiliation:
REFINE Lab, University of Connecticut, 159 Discovery Dr. Storrs, CT, USA.
V Ray
Affiliation:
REFINE Lab, University of Connecticut, 159 Discovery Dr. Storrs, CT, USA.
S Shahbazmohamadi
Affiliation:
REFINE Lab, University of Connecticut, 159 Discovery Dr. Storrs, CT, USA.

Abstract

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Type
Leveraging 3D Imaging and Analysis Methods for New Opportunities in Material Science
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 344 - 345
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Ho, J et al. , IEEE Electrical Insulation Magazine. 26 (2010), p. 20.Google Scholar
[2]O'Malley, P et al. , 55th Annual NDIA Fuze Conference (2011), p. 269.Google Scholar
[3]Favata, J et al. , Microscopy & Microanalysis 24 (2018), p. 362.Google Scholar