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Correlation of Electron Diffraction between t-EBSD in the SEM, CBED in the TEM and ACOM using ASTAR in the TEM using GaN Nanowires

Published online by Cambridge University Press:  23 September 2015

Roy H. Geiss
Roy H. Geiss*
Affiliation:
Department of Chemistry, Colorado State University, Fort Collins, CO 80523-1872, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1249 - 1250
Copyright
Copyright © Microscopy Society of America 2015 

References

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