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Correlating Automated High-Throughput ADF-STEM and 4D-STEM Imaging for the Characterization of Irradiation-Induced Defects

Published online by Cambridge University Press:  22 July 2022

Alex Lin
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, United States
Sean H. Mills
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, United States Department of Materials Science and Engineering, University of California, Berkeley, CA, United States
Alexander Pattison
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, United States
Wolfgang Theis
Affiliation:
Nanoscale Physics Research Laboratory, School of Physics and Astronomy, University Birmingham, Birmingham, United Kingdom
Andrew Minor
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, United States Department of Materials Science and Engineering, University of California, Berkeley, CA, United States
Peter Ercius*
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, United States
*
*Corresponding author: [email protected]

Abstract

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Type
Correlative Microscopy and High-Throughput Characterization for Accelerated Development of Materials in Extreme Environments
Copyright
Copyright © Microscopy Society of America 2022

References

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Primary support for this work came from FUTURE (Fundamental Understanding of Transport Under Reactor Extremes), an Energy Frontier Research Center funded by the U.S. Department of Energy, Office of Science, Basic Energy Sciences. Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.Google Scholar