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Correlating Automated High-Throughput ADF-STEM and 4D-STEM Imaging for the Characterization of Irradiation-Induced Defects
Published online by Cambridge University Press: 22 July 2022
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- Type
- Correlative Microscopy and High-Throughput Characterization for Accelerated Development of Materials in Extreme Environments
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- Copyright
- Copyright © Microscopy Society of America 2022
References
Primary support for this work came from FUTURE (Fundamental Understanding of Transport Under Reactor Extremes), an Energy Frontier Research Center funded by the U.S. Department of Energy, Office of Science, Basic Energy Sciences. Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.Google Scholar
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