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Correction for linear and non-linear distortions of STEM images

Published online by Cambridge University Press:  30 July 2021

Pavel Potapov  and
Axel Lubk
Pavel Potapov
Affiliation:
IFW-Dresden, Dresden, Sachsen, Germany
Axel Lubk
Affiliation:
IFW Dresden, Germany, United States

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2320 - 2322
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Jones, L. et al. Microscopy and Microanalysis 19 (2013) 1050.CrossRefGoogle Scholar
Sang, X. et al. Ultramicroscopy 138 (2014) 28.CrossRefGoogle Scholar
Ophus, C. et al. Ultramicroscop y162 (2016) 1.CrossRefGoogle Scholar
http://temdm.com/web/stem-correction/Google Scholar