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Correcting Scan Distortions in Cryogenic 4DSTEM Acquisitions using Affine Transformations

Published online by Cambridge University Press:  22 July 2022

Jacob Smith ,
Wenpei Gao ,
Miaofang Chi  and
Guannan Zhang
Jacob Smith
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, USA Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, United States
Wenpei Gao
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, USA
Miaofang Chi
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, United States
Guannan Zhang
Affiliation:
Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA

Abstract

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Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 490 - 491
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Copyright
Copyright © Microscopy Society of America 2022

References

This research is supported by the U.S. Department of Energy, Office of Science, Office of Advanced Scientific Computing Research, the Scientific Machine Learning Program, and performed at Oak Ridge National Laboratory (ORNL). ORNL is operated by UT-Battelle, LLC, for the U.S. Department of Energy under Contract DE-AC05-00OR22725. The microscopy work was supported by an Early Career project supported by DOE Office of Science FWP #ERKCZ55–KC040304. All microscopy technique development was performed and supported by Oak Ridge National Laboratory's (ORNL) Center for Nanophase Materials Sciences (CNMS), which is a DOE Office of Science User FacilityGoogle Scholar