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Convenient Contrast Enhancement by Hole-Free Phase Plate in a TEM

Published online by Cambridge University Press:  01 August 2010

M Malac
Affiliation:
National Institute for Nanotechnology, Canada
M Kawasaki
Affiliation:
JEOL USA
M Beleggia
Affiliation:
Technical University, Denmark
P Li
Affiliation:
National Institute for Nanotechnology, Canada
RF Egerton
Affiliation:
University of Alberta, Canada

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2010