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Controlling Beam-Sample Interaction in Low Dimensional Materials by Low Dose Rate Electron Microscopy

Published online by Cambridge University Press:  23 September 2015

Christian Kisielowski ,
S. Helveg ,
L. Hansen  and
P. Specht
Christian Kisielowski
Affiliation:
The Molecular Foundry and Joint Center for Artificial Photosynthesis, Lawrence Berkeley National Laboratory, One Cyclotron Rd., Berkeley CA 94720, USA
S. Helveg
Affiliation:
Haldor Tops0e A/S, Nym0llevej 55, DK-2800 Kgs. Lyngby, Denmark
L. Hansen
Affiliation:
Haldor Tops0e A/S, Nym0llevej 55, DK-2800 Kgs. Lyngby, Denmark
P. Specht
Affiliation:
Dep. of Materials Science and Engineering, UC Berkeley, Berkeley CA 94720, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1321 - 1322
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Alem, N., Yazyev, O.V., Kisielowski, C., Denes, P., et al., PRL 106, 126102 (2011).CrossRefGoogle Scholar
[2] Kisielowski, C., Wang, L.-W., Specht, Petra, et al, Phys Rev. B 88, 024305 (2013).CrossRefGoogle Scholar
[3] Kisielowski, C., Specht, P., Gygax, S.M., Barton, B. & Calderon, H.A., Micron 68, 186 (2015).Google Scholar
[4] Helveg, S., Kisielowski, C.F., Jinschek, J.R., Specht, P., et al., Micron 68, 176 (2015).CrossRefGoogle Scholar
[5] Electron Microscopy at the Molecular Foundry was supported by the Office of Science, Of-fice of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231..Google Scholar