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Controlled Growth of Silicon Dioxide Nanospheres by Regulation in the Addition Rate of the Precursor
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials
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- Copyright
- Copyright © Microscopy Society of America 2019
References
[2]Maughan Jones, CJ and Munro, PRT, Journal of Biomedical Optics 22(9) (2017), p. 095004.Google Scholar
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[8]The authors acknowledge funding from the Consejo Nacional de Ciencia y Tecnología (CONACyT), through projects 573 and 255791-INFR 2015.Google Scholar
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