Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Tanaka, Nobuo
2008.
Advances in IMAGING AND ELECTRON PHYSICS - Aberration–Corrected Electron Microscopy.
Vol. 153,
Issue. ,
p.
385.
Kabius, Bernd
and
Rose, Harald
2008.
Advances in IMAGING AND ELECTRON PHYSICS - Aberration–Corrected Electron Microscopy.
Vol. 153,
Issue. ,
p.
261.
Yamasaki, Jun
Kawai, Tomoyuki
Kondo, Yushi
and
Tanaka, Nobuo
2008.
A Practical Solution for Eliminating Artificial Image Contrast in Aberration-Corrected TEM.
Microscopy and Microanalysis,
Vol. 14,
Issue. 1,
p.
27.
2022.
Principles of Electron Optics, Volume 3.
p.
1869.