Hostname: page-component-78c5997874-j824f Total loading time: 0 Render date: 2024-11-05T21:43:19.737Z Has data issue: false hasContentIssue false
  • English
  • Français

Continuous Wavelet Transforms for Measuring Roughness of Nanoscale Interfaces

Published online by Cambridge University Press:  01 August 2018

Darren Homeniuk ,
Marek Malac  and
Misa Hayashida
Darren Homeniuk
Affiliation:
Nanotechnology Research Center, 11421 Saskatchewan Drive, T6G 2M9, Edmonton, Alberta, Canada
Marek Malac
Affiliation:
Nanotechnology Research Center, 11421 Saskatchewan Drive, T6G 2M9, Edmonton, Alberta, Canada Department of Physics, University of Alberta, T6G 2E1, Edmonton, Alberta, Canada
Misa Hayashida
Affiliation:
Nanotechnology Research Center, 11421 Saskatchewan Drive, T6G 2M9, Edmonton, Alberta, Canada

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1048 - 1049
Copyright
© Microscopy Society of America 2018 

References

[1] Grier, A., et al, Journal of Applied Physics 118 2015) p. 224308.Google Scholar
[2] Hayashida, M., et al, JVST B 33 2015) p. 040605.Google Scholar
[3] Malac, M., et al, Nano Testing Symposium 2017) p. 247–250.Google Scholar
[4] Addison, P. in The Illustrated Wavelet Transform Handbook (2nd ed. CRC Press London p. 7–92.Google Scholar
[5] Lilly, J. Olhede, S. IEEE Transactions on Signal Processing 60 2012) p. 6036–6040.Google Scholar