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Contamination Mitigation Strategy for Ultra-Low Energy Electron Microscopy and Spectroscopy

Published online by Cambridge University Press:  05 August 2019

Eliška Materna Mikmeková ,
Luděk Frank ,
Ivo Konvalina ,
Ilona Müllerová ,
Tao Zhang  and
Tewodros Asefa
Eliška Materna Mikmeková*
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments of the CAS, v. v. i., Brno, Czech Republic.
Luděk Frank
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments of the CAS, v. v. i., Brno, Czech Republic.
Ivo Konvalina
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments of the CAS, v. v. i., Brno, Czech Republic.
Ilona Müllerová
Affiliation:
Department of Electron Microscopy, Institute of Scientific Instruments of the CAS, v. v. i., Brno, Czech Republic.
Tao Zhang
Affiliation:
Department of Chemistry and Chemical Biology and Department of Chemical and Biochemical Engineering, Rutgers University, Piscataway NJ, USA.
Tewodros Asefa
Affiliation:
Department of Chemistry and Chemical Biology and Department of Chemical and Biochemical Engineering, Rutgers University, Piscataway NJ, USA.
*
*Corresponding author: [email protected]

Abstract

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Type
Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 500 - 501
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Ramsier, RD and Yates, JT Jr., Surface Science Reports 12 (1991), p. 246.Google Scholar
[2]Madye, TE and Yates, JT Jr., Journal of Vacuum Science and Technology 8 (1995), p. 525.Google Scholar
[3]Frank, L, Mikmeková, E and Lejeune, M, Applied Surface Science 407 (2017), p. 105.Google Scholar
[4]Mikmeková, E et al. , Diamond and Related Materials 63 (2015), p. 136.Google Scholar
[5]Suzuki, S in “Nanotechnology and Nanomaterials: Electronic Properties of Carbon Nanotubes”, (2011) p. 329.Google Scholar
[6]The authors acknowledge funding from the Technology Agency of the Czech Republic (Centre of Electron and Photonic Optics, no: TN01000008 and TG03010046).Google Scholar