Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Wang, Yi
Suyolcu, Y. Eren
Salzberger, Ute
Hahn, Kersten
Srot, Vesna
Sigle, Wilfried
and
van Aken, Peter A.
2018.
STEM SI Warp: A Tool for Correcting the Linear and Nonlinear Distortions for Atomically Resolved STEM Spectrum and Diffraction Imaging.
Microscopy and Microanalysis,
Vol. 24,
Issue. S1,
p.
132.
de Jonge, Niels
Mølhave, Kristian
and
Alloyeau, Damien
2019.
Introduction to the Proceedings of CISCEM 2018 - the 4th Conference on In-Situ and Correlative Electron Microscopy.
Microscopy and Microanalysis,
Vol. 25,
Issue. S1,
p.
1.