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Conference on In Situ and Correlative Electron Microscopy (CISCEM 2016)

Published online by Cambridge University Press:  21 December 2016

Niels de Jonge
Affiliation:
INM – Leibniz Institute for New Materials, 66123 Saarbrücken, Germany Department of Physics, University of Saarland, 66123 Saarbrücken, Germany
Kristian Mølhave
Affiliation:
Dept. of Micro and Nanotechnology, Technical University of Denmark (DTU), Denmark
Damien Alloyeau
Affiliation:
Laboratoire Matériaux et Phénomènes Quantiques, Université Paris 7 - CNRS, Paris, France

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016