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Complex Dielectric Function and Optical Properties for the Perovskite BCZT via VEELS–STEM.

Published online by Cambridge University Press:  30 July 2021

G. Herrera-Perez
Affiliation:
Centro de Investigación en Materiales Avanzados, Chihuahua, Chihuahua, Mexico
Carlos Ornelas-Gutiérrez
Affiliation:
Centro de Investigación en Materiales Avanzados
Sergio Marungo-Ramirez
Affiliation:
Universidad Tecnologica de Chihuahua campus Sur, United States
Armando Reyes-Rojas
Affiliation:
Centro de Investigacion en Materiales Avanzados, United States
Luis Fuentes-Cobas
Affiliation:
Centro de Investigacion en Materiales Avanzados, United States

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Yu, P. Y. and Cardona, M.. Fundamentals of semiconductors, Springer, Berlin 1999.Google Scholar
Herrera-Pérez, G. et al. , J. Appl. Phys. 128 (2020), 064106.CrossRefGoogle Scholar
Herrera-Pérez, G. et al. , J. Appl. Phys. 120 (2016), 094303.CrossRefGoogle Scholar
Digital Micrograph EELS Analysis User's Guide. Gatan, Inc. (2003) USA.Google Scholar