Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-22T20:04:27.365Z Has data issue: false hasContentIssue false

Comparisons of Linear and Nonlinear Image Restoration

Published online by Cambridge University Press:  11 October 2006

Lan-Yun Chang
Affiliation:
Department of Materials, Oxford University, Parks Road, Oxford, OX1 3PH, UK
Angus I. Kirkland
Affiliation:
Department of Materials, Oxford University, Parks Road, Oxford, OX1 3PH, UK
Get access

Abstract

Exit wave restoration using focus series of images has become a widely used technique to improve image resolution and interpretation. To understand the effects of the imaging approximations used, we have critically compared the specimen exit wave functions restored using the efficient linear Wiener filter, with a general nonlinear maximum likelihood method.

Type
Research Article
Copyright
© 2006 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Chang, L.Y., Meyer, R.R., & Kirkland, A.I. (2005). Calculations of HREM image intensity using Monte Carlo integration. Ultramicroscopy 101, 171181.Google Scholar
Coene, W. & Van Dyck, D. (1988). New aspect in nonlinear image processing for high resolution electron microscopy. Scan Microsc 2, 213224.Google Scholar
Coene, W.M.J., Thust, A., Op de Beeck, M., & Van Dyck, D. (1996). Maximum likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy. Ultramicroscopy 64, 109135.Google Scholar
Cowley, J.M. & Moodie, A.F. (1957). The scattering of electrons by atoms and crystals. I. A new theoretical approach. Acta Crystallogr 10, 609.Google Scholar
Hanssen, K.J. & Trepte, L. (1971). The influence of voltage and current fluctuations and of a finite energy width of the electrons on contrast and resolution in electron microscopy. Optik 32, 519538.Google Scholar
Hawkes, P.W. (1980). Image processing based on the linear theory of image formation. In Computer Processing of Electron Microscope Images, Hawkes, P.W. (Ed.), pp. 228. Berlin: Springer-Verlag.
Hopkins, H.H. (1953). On the diffraction theory of optical images. Proc Roy Soc A 217, 408432.Google Scholar
Humphreys, C.J. & Spence, J.C.H. (1981). Resolution and illumination coherence in electron microscopy. Optik 58, 125144.Google Scholar
Kirkland, E.J. (1982). Nonlinear high resolution image processing of conventional transmission electron micrographs I. Theory. Ultramicroscopy 9, 4564.Google Scholar
Kirkland, E.J. (1984). Improved high resolution image processing of bright field electron micrographs I. Theory. Ultramicroscopy 17, 151172.Google Scholar
Op de Beeck, M., Van Dyck, D., & Coene, W. (1996). Wave function reconstruction in HRTEM: The parabola method. Ultramicroscopy 64, 167183.Google Scholar
Press, W.H., Teukolsky, S.A., Vetterling, W.T., & Flannery, B.P. (2002). Numerical Recipes in C++: The Art of Scientific Computing, 2nd ed. Cambridge: Cambridge University Press.
Saxton, W.O. (1978). Computer Techniques for Imaging Processing in Electron Microscopy. New York and London: Academic Press.
Saxton, W.O. (1980). Computer processing of electron microscope images. In Topics of Current Physics, Hawkes, P.W. (Ed.), pp. 3587. Berlin: Springer-Verlag.
Saxton, W.O. (1988). Accurate atom positions from focal and tilted beam series of high-resolution electron-micrographs. Scan Microsc 2, 213224.Google Scholar
Schiske, P. (1968). Zur Frage der Bildrekonstruktion durch Fokusreihen. In Proceedings of the 4th Regional Congress on Electron Microscopy, vol. 1, p. 145. Rome, Italy: Tipografia Poliglotta Vaticana.
Schiske, P. (1973). Image processing using additional statistical information about the object. In 5th European Conference on Electron Microscopy, Image Processing and Computer-Aided Design in Electron Optics, Hawkes, P.W. (Ed.), p. 82. Manchester: Academic Press.
Spence, J.C.H. (1988). Experimental High-Resolution Electron Microscopy, 2nd ed. Oxford: Oxford University Press.
Spence, J.C.H. (1999). The future of atomic resolution electron microscopy for materials science. Mater Sci Eng R26, 149.Google Scholar