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Comparison of Detection Limits for Elemental Mapping by EF-TEM and STEMXEDS

Published online by Cambridge University Press:  01 August 2002

Masashi Watanabe ,
David B. Williams  and
Yoshitsugu Tomokiyo
Masashi Watanabe
Affiliation:
Dept. of Materials Science and Engineering, Lehigh University, Bethlehem, PA 18015 USA
David B. Williams
Affiliation:
Dept. of Materials Science and Engineering, Lehigh University, Bethlehem, PA 18015 USA
Yoshitsugu Tomokiyo
Affiliation:
Dept. of Materials Science and Engineering, Kyushu University, Fukuoka 812-8581, Japan

Abstract

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Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1588 - 1589
Copyright
Copyright © Microscopy Society of America 2002